Comparison of Critical Current Scaling Behaviors in {MgB}2/SiC/Si Thin Films
Abstract
Scaling behaviors of critical current density Jc in {MgB}2 thin films are investigated on different films with thickness of 100 nm, in comparison with 50- and 10-nm films based on a comprehensive scaling formula. Experimental data are reduced and analyzed with the formula over a wide range of magnitudes. In 100- and 50-nm films the single scaling function has been able to fit experimental Jc data up to ten orders of magnitudes with appropriate flux pinning parameters. On the other hand, for the 10-nm film, different Jc dependences were found on temperature and magnetic field, concerning anomalous or granular superconductivity.
- Publication:
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Journal of Low Temperature Physics
- Pub Date:
- June 2017
- DOI:
- 10.1007/s10909-017-1777-z
- Bibcode:
- 2017JLTP..187..565N