Enhanced Negative Bias Stress Degradation in Multigate Polycrystalline Silicon Thin-Film Transistors
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- October 2017
- DOI:
- 10.1109/TED.2017.2737489
- Bibcode:
- 2017ITED...64.4363Z