Comparison of SOI Versus Bulk FinFET Technologies for 6T-SRAM Voltage Scaling at the 7-/8-nm Node
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- January 2017
- DOI:
- 10.1109/TED.2016.2626397
- Bibcode:
- 2017ITED...64..329Z