Single Photon Counting Spatial Uniformity of 4H-SiC APD Characterized by SNOM-Based Mapping System
Abstract
- Publication:
-
IEEE Photonics Technology Letters
- Pub Date:
- October 2017
- DOI:
- 10.1109/LPT.2017.2735625
- Bibcode:
- 2017IPTL...29.1603C