Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Makarov, Alexander ; Vexler, Mikhail I. ; Kaczer, Ben ; Grasser, Tibor Abstract Publication: IEEE Electron Device Letters Pub Date: February 2017 DOI: 10.1109/LED.2016.2645901 Bibcode: 2017IEDL...38..160S