Three-Dimensional Characterization of Dislocation-Defect Interactions
Abstract
Transmission electron microscopes play a critical role in building our knowledge base of the atomic structure and composition as well as the electronic and magnetic state of materials. This information is a two-dimensional snapshot of the material state and requires a posteriori analysis to reveal the reaction or processing pathway, or to correlate with a macroscopic property. However, using electron tomography it is feasible to recover the information lost in the electron beam direction and obtain a three-dimensional view of the internal structure in an electron transparent foil. In this paper, example applications of diffraction-contrast electron tomography to understand various dislocation-obstacle interactions are presented and discussed.
- Publication:
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1st International Conference on 3D Materials Science
- Pub Date:
- 2016
- DOI:
- 10.1007/978-3-319-48762-5_32
- Bibcode:
- 2016tdms.conf..209K
- Keywords:
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- Materials Science