Investigation of mixed-host organic light emitting diodes

One of the limiting factors to the OLED stability or lifetime is the charge buildup at the bilayer heterojunction (HJ) between the hole transport layer (HTL) and electron transport layer (ETL). In recent years, this abrupt interface has been moderated by mixing HTL and ETL to form a single mixed-host, light emitting layer. For uniformly mixed-host (UM) OLED, the device lifetime and also the efficiency were improved due to the spatial broadening of the recombination zone. Similar device architectures, such as the step-wise graded mixed-host (SGM-OLED) and the continuously graded mixed-host (CGM-OLED) have also been implemented by a number of researchers. In this work, a premix of hole transport material (HTM) and electron transport material (ETM), namely TPD and Alq, is prepared for one-step thermal evaporation of the mixed-host light emitting layer (EML). Depending on the evaporation rate, the CGM-OLEDs with different concentration profiles of HTM and ETM in the EML are obtained, which are inversely proportional to each other.