The Nanolathe - a Dedicated Two-axis Positioner for Concentric Sample Rotation. Smith, A. J. ; Schock, Klaus ; Kleindiek, Stephan ; Gerstl, Stephan Abstract Publication: Microscopy and Microanalysis Pub Date: July 2016 DOI: 10.1017/S1431927616004281 Bibcode: 2016MiMic..22S.686S