Dictionary-based Filling of the Missing Wedge in Electron Tomography Trampert, Patrick ; Chen, Delei ; Bogachev, Sviatoslav ; Dahmen, Tim ; Slusallek, Philipp Abstract Publication: Microscopy and Microanalysis Pub Date: July 2016 DOI: 10.1017/S1431927616003627 Bibcode: 2016MiMic..22S.554T