Secondary electron emission in the limit of low incident electron energies
Abstract
A detailed review of experimental and theoretical studies of secondary electron emission (SEE) at low incident electron energies has been recently given in paper. In particularly, discussion of some authors' statement on increase of the SEE yield up to unity if the primary electron energy tends to zero was reviewed. Present paper considers a technique for measurements of SEE yield near a sample surface making use of a magnetic field parallel to the surface. Using this technique it was shown that the SEE yield can approach unity for a polycrystalline, but not for a monocrystalline sample. This result was explained by additional reflection of primary electrons from a potential barrier near the sample surface. Therefore for suppression of the deleterious effects of SEE, e.g, for better performance of accelerators, it is important to monitor and control micro electric-fields arising near a polycrystalline surface.
- Publication:
-
APS Annual Gaseous Electronics Meeting Abstracts
- Pub Date:
- September 2016
- Bibcode:
- 2016APS..GECMW6146M