First Measurements with Atom Trap Trace Analysis of Krypton in Xenon Used for Dark Matter Search
Abstract
An Atom Trap Trace Analysis (ATTA) device has been developed for measuring the Kr concentration in the Xe used in the XENON direct dark matter search experiments. Measurements of Kr/Xe down to O (10 parts per trillion (ppt)) and O (100 ppt) have been completed using ATTA and independently verified with a specialized mass spectrometer. The ATTA measurement method and results will be discussed, along with the outlook for XENON1T.
We acknowledge continued support of the XENON Dark Matter program at Columbia University by the National Science Foundation.- Publication:
-
APS April Meeting Abstracts
- Pub Date:
- March 2016
- Bibcode:
- 2016APS..APRE16006G