Microwave Imaging Reflectometry On Diii-D Tobias, B. ; Kramer, G. ; Valeo, E. J. ; Muscatello, C. M. ; Ren, X. ; Chen, M. ; Spear, A. G. ; Pham, A. V. ; Phan, T. ; Mamidanna, M. A. ; Lai, J. ; Li, M. ; Fu, D. ; Hu, F. ; Domier, C. ; Luhmann, N., Jr. ; Zemedkun, S. ; Munsat, T. ; Zhu, Y. Abstract Publication: 1st EPS conference on Plasma Diagnostics (ECPD2015) Pub Date: 2015 DOI: 10.22323/1.240.0004 Bibcode: 2015ecpd.confE...4T