Graphene layer on Rh(111): combined DFT, STM, and NC-AFM studies
Abstract
The simultaneous combination of scanning probe methods (tunnelling and force microscopies, STM and AFM) is a unique way to get an information about crystallographic and electronic structure of the studied surface. Here we apply these methods accompanied by the state-of-the-art density functional theory (DFT) calculations to shed a light on the structure and electronic properties of the strongly-corrugated graphene/Rh(111) system. The atomically resolved images are obtained for both STM and AFM modes and compared with the DFT results showing good agreement between theory and experiment.
- Publication:
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arXiv e-prints
- Pub Date:
- February 2015
- DOI:
- 10.48550/arXiv.1502.00975
- arXiv:
- arXiv:1502.00975
- Bibcode:
- 2015arXiv150200975S
- Keywords:
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- Condensed Matter - Materials Science
- E-Print:
- MRS Singapore - ICMAT Symposia Proceedings