Defect levels in Cu(In,Ga)Se2 polycrystalline layers by sub-bandgap photo-induced current transient spectroscopy
Abstract
- Publication:
-
Thin Solid Films
- Pub Date:
- May 2015
- DOI:
- 10.1016/j.tsf.2014.10.064
- Bibcode:
- 2015TSF...582..383M