Combined TOF-SIMS and NanoSIMS Analysis of Gently Separated Presolar SiC Grains
Abstract
Gently separated presolar SiC grains will be analysed in order to gain further understanding of the grain surfaces and coatings. TOF-SIMS and NanoSIMS will be used to provide a detailed analysis of the elemental/isotopic composition and distribution.
- Publication:
-
78th Annual Meeting of the Meteoritical Society
- Pub Date:
- July 2015
- Bibcode:
- 2015LPICo1856.5321C