Thermal Characterization Using Optical Methods of AlGaN/GaN HEMTs on SiC Substrate in RF Operating Conditions
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- December 2015
- DOI:
- 10.1109/TED.2015.2493204
- Bibcode:
- 2015ITED...62.3992B