(Invited) Enabling SiC Yield and Reliability through Epitaxy and Characterization Das, Hrishikesh ; Sunkari, Swapna ; Domeij, Martin ; Konstantinov, Andrei ; Allerstam, Fredrik ; Neyer, Thomas Abstract Publication: ECS Transactions Pub Date: September 2015 DOI: 10.1149/06911.0029ecst Bibcode: 2015ECSTr..69k..29D