Doping-dependent band structure of LaAlO3/SrTiO3 interfaces by soft x-ray polarization-controlled resonant angle-resolved photoemission
Abstract
Polarization-controlled synchrotron radiation was used to map the electronic structure of buried conducting interfaces of LaAlO3/SrTiO3 in a resonant angle-resolved photoemission experiment. A strong polarization dependence of the Fermi surface and band dispersions is demonstrated, highlighting different Ti 3d orbitals involved in two-dimensional (2D) conduction. Measurements on samples with different doping levels reveal different band occupancies and Fermi-surface areas. The photoemission results are directly compared with advanced first-principles calculations, carried out for different 3d-band filling levels connected with the 2D mobile carrier concentrations obtained from transport measurements, with indication of charge localization at the interface.
- Publication:
-
Physical Review B
- Pub Date:
- March 2014
- DOI:
- 10.1103/PhysRevB.89.121412
- arXiv:
- arXiv:1307.6943
- Bibcode:
- 2014PhRvB..89l1412C
- Keywords:
-
- 73.20.-r;
- 71.15.Mb;
- 79.60.Jv;
- Electron states at surfaces and interfaces;
- Density functional theory local density approximation gradient and other corrections;
- Interfaces;
- heterostructures;
- nanostructures;
- Condensed Matter - Strongly Correlated Electrons
- E-Print:
- Main Text: 12 pages, 4 figures