Absorption Corrections for a Four-Quadrant SuperX EDS Detector Yang, F. ; Scheltens, F. ; McComb, D. ; Williams, D. B. ; De Graef, M. Abstract Publication: Microscopy and Microanalysis Pub Date: August 2014 DOI: 10.1017/S1431927614002220 Bibcode: 2014MiMic..20S.100Y