Single-Event Cluster Multibit Upsets Due to Localized Latch-Up in a 90 nm COTS SRAM Containing SEL Mitigation Design
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- August 2014
- DOI:
- 10.1109/TNS.2014.2314722
- Bibcode:
- 2014ITNS...61.1918Y