Neutron and Alpha Single Event Upsets in Advanced NAND Flash Memories Gerardin, S. ; Bagatin, M. ; Paccagnella, A. ; Ferlet-Cavrois, V. ; Visconti, A. ; Frost, C. D. Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: August 2014 DOI: 10.1109/TNS.2014.2328097 Bibcode: 2014ITNS...61.1799G