Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs
Abstract
- Publication:
-
IEEE Transactions on Microwave Theory Techniques
- Pub Date:
- September 2014
- DOI:
- 10.1109/TMTT.2014.2340375
- Bibcode:
- 2014ITMTT..62.1973O