Analysis of conduction mechanism in silicon nitride-based RRAM Jung, Sunghun ; Kim, Sungjun ; Oh, Jeong Hoon ; Ryoo, Kyung Chang ; Lee, Jong Ho ; Shin, Hyungcheol ; Park, Byung Gook Abstract Publication: International Journal of Nanotechnology Pub Date: 2014 DOI: 10.1504/IJNT.2014.059820 Bibcode: 2014IJNT...11..167J