A random matrix approach to detect defects in a strongly scattering polycrystal: How the memory effect can help overcome multiple scattering
Abstract
We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is used to capture the Green's matrix in a backscattering configuration. Because of multiple scattering, conventional imaging completely fails to detect the deepest flaws. We utilize a random matrix approach, taking advantage of the deterministic coherence of the backscattered wave-field which is characteristic of single scattering and related to the memory effect. This allows us to separate single and multiple scattering contributions. As a consequence, we show that flaws are detected beyond the conventional limit, as if multiple scattering had been overcome.
- Publication:
-
Applied Physics Letters
- Pub Date:
- June 2014
- DOI:
- 10.1063/1.4882421
- arXiv:
- arXiv:1405.6526
- Bibcode:
- 2014ApPhL.104w4105S
- Keywords:
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- Condensed Matter - Other Condensed Matter;
- Condensed Matter - Disordered Systems and Neural Networks;
- Physics - Data Analysis;
- Statistics and Probability
- E-Print:
- 11 pages, 4 figures