Thin film NMR T1 measurement by MRFM using cyclic adiabatic inversion
Abstract
We obtained the NMR spectrum and the spin lattice relaxation time (T1) for thin film samples using Magnetic Resonance Force Microscopy (MRFM). The samples were Alq3, which is widely used as an organic light emitting diode (OLED), thin films of 150 nm thick and a bulk crystal. T1 was measured by using the cyclic adiabatic inversion method at a fixed frequency of 297 MHz and at 12 K. To confirm the reliability of our measurement technique we compared the result with that obtained by conventional NMR method. T1 of thin film samples was measured and compared with that of the bulk sample.
thin film, MRFM.- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 2014
- Bibcode:
- 2014APS..MAR.C1358K