X-ray photoelectron spectroscopy (XPS) and diffraction (XPD) study of a few layers of graphene on 6H-SiC(0001)
Abstract
Thin films of a few layers of graphene obtained by solid-state graphitization from 6H-SiC(0001) substrates have been studied by X-ray photoelectron spectroscopy (XPS) and X-ray photoelectron diffraction (XPD). The C1s core-level was resolved into components, which were associated with carbon from bulk SiC, carbon from graphene and carbon at the graphene/6H-SiC(0001)interface. Then, the intensity of each of these components was recorded as a function of the polar (azimuth) angle for several azimuth (polar) angles. These XPD measurements provide crystallographic information which clearly indicates that the graphene sheets are organized in a graphite-like structure on 6H-SiC(0001), an organisation that results from the shrinking of the 6H-SiC(0001) lattice after Si depletion. Finally the decoupling of graphene from the 6H-SiC(0001) substrate by oxygen intercalation was studied from the XPS point of view.
Epitaxial graphene on SiC 6H was investigated with XPS and XPD. The signature of graphene was identified through XPD measurements. The effect of oxygen intercalation was investigated.- Publication:
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Surface Science
- Pub Date:
- September 2013
- DOI:
- 10.1016/j.susc.2013.04.006
- Bibcode:
- 2013SurSc.615...47F