Evaluating Neutron Induced SEE in SRAM-Based FPGA Protected by Hardware- and Software-Based Fault Tolerant Techniques
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 2013
- DOI:
- 10.1109/TNS.2013.2288305
- Bibcode:
- 2013ITNS...60.4243A