Study of Radiation Effects on CREAM Electronics
Abstract
The Cosmic Ray Energetics and Mass (CREAM) instrument is currently being reconfigured for the International Space Station (ISS). The space radiation environment originating from several sources, such as galactic cosmic rays, energetic solar particles from the Sun, and trapped particles in the radiation belts, create special design challenges. Environments with high levels of ionizing radiation can cause Single Event Effects (SEEs), such as bit flips, current spikes, and other malfunctions in electronic components. SEEs in electronic components have been studied using heavy ion beams, 15 MeV/amu He, Ne, Ar, Cu, Xe, and Au nuclei, in the range of Linear Energy Transfer (LET) from 0.121 to 85.4 MeV-cm2/mg. Single Event Latchup (SEL) and Single Event Transient (SET) rates were measured. Results from radiation tests performed at the Texas A&M University cyclotron beam facility and projections to the electronics' performance aboard the ISS are presented.
- Publication:
-
International Cosmic Ray Conference
- Pub Date:
- 2013
- Bibcode:
- 2013ICRC...33.1944A
- Keywords:
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- CREAM;
- single event effect;
- ISS