Tip-Enhanced Near-Field Optical Microscopy of Carbon Nanotubes
Abstract
We review recent experimental studies on single-walled carbon nanotubes on substrates using tip-enhanced near-field optical microscopy TENOM). High-resolution optical and topographic imaging with sub 15 nm spatial resolution is shown providing novel insights into the spectroscopic properties of these nanoscale materials. In the case of semiconducting nanotubes the simultaneous observation of Raman scattering and photoluminescence (PL) is possible enabling a direct correlation between vibrational and electronic properties on the nanoscale. So far applications of TENOM were focused on the spectroscopy of localized phonon modes, local band energy renormalizations induced by charge carrier doping, the environmental sensitivity of nanotube PL, and inter-nanotube energy transfer. At the end of this review we discuss remaining limitations and challenges.
- Publication:
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Raman Imaging: Techniques and Applications
- Pub Date:
- 2012
- DOI:
- 10.1007/978-3-642-28252-2_10
- Bibcode:
- 2012raim.book..301G
- Keywords:
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- Physics