Structural transformations in ZnS:Cu in the course of thermal annealing Bacherikov, Yu. Yu. ; Korsunska, N. E. ; Kladko, V. P. ; Venger, E. F. ; Baran, N. P. ; Kuchuk, A. V. ; Zhuk, A. G. Abstract Publication: Semiconductors Pub Date: February 2012 DOI: 10.1134/S1063782612020030 Bibcode: 2012Semic..46..188B