Dissociative electron attachment to C2F5 radicals
Abstract
Dissociative electron attachment to the reactive C2F5 molecular radical has been investigated with two complimentary experimental methods; a single collision beam experiment and a new flowing afterglow Langmuir probe technique. The beam results show that F- is formed close to zero electron energy in dissociative electron attachment to C2F5. The afterglow measurements also show that F- is formed in collisions between electrons and C2F5 molecules with rate constants of 3.7 × 10-9 cm3 s-1 to 4.7 × 10-9 cm3 s-1 at temperatures of 300-600 K. The rate constant increases slowly with increasing temperature, but the rise observed is smaller than the experimental uncertainty of 35%.
- Publication:
-
Journal of Chemical Physics
- Pub Date:
- August 2012
- DOI:
- 10.1063/1.4738759
- Bibcode:
- 2012JChPh.137e4310H
- Keywords:
-
- dissociation;
- electron attachment;
- fluorine;
- free radicals;
- ion-molecule collisions;
- Langmuir probes;
- negative ions;
- organic compounds;
- 34.80.Lx;
- 52.70.Ds;
- 34.50.Gb;
- 34.70.+e;
- Electron-ion recombination and electron attachment;
- Electric and magnetic measurements;
- Electronic excitation and ionization of molecules;
- intermediate molecular states;
- Charge transfer