A 3-D large area imaging sistem with very high performances
Abstract
- Publication:
-
Proceedings of the 10th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD11). 6-8 July 2011. Florence
- Pub Date:
- 2011
- DOI:
- 10.22323/1.143.0014
- Bibcode:
- 2011lsrs.confE..14L