Theoretical investigation of dielectronic recombination of Sn12+ ions
Abstract
Theoretical calculations have been made for the dielectronic recombination (DR) rate coefficients of Sn12+ ion using a relativistic flexible atomic code with configuration interaction. Comparison of the rate coefficients for 4s, 4p, and 4d subshell excitation shows that while the 4p subshell excitation dominates over the whole temperature region, 4d subshell excitation at low temperature and 4s subshell excitation at high temperature cannot be neglected. In order to facilitate simple applications, the calculated DR rate coefficients are fitted to an empirical formula. The total DR rate coefficient is greater than either the radiative recombination or three-body recombination coefficients for electron temperatures greater than 1 eV. Therefore, DR can strongly influence the ionization balance of laser-produced tin plasmas.
- Publication:
-
Physical Review A
- Pub Date:
- June 2011
- DOI:
- 10.1103/PhysRevA.83.062708
- Bibcode:
- 2011PhRvA..83f2708F
- Keywords:
-
- 34.80.Lx;
- 34.80.Dp;
- Electron-ion recombination and electron attachment;
- Atomic excitation and ionization by electron impact