Effect of the Source Field Plate on AlGaN/GaN High Electron Mobility Transistors during Off-State Stress Liu, Lu ; Kang, Tsung-Sheng ; Cullen, David A. ; Zhou, Lin ; Kim, Jinhyung ; Chang, C. Y. ; Douglas, Erica ; Jang, Soohwan ; Smith, David J. ; Pearton, S. J. ; Johnson, Wayne J. ; Ren, F. Abstract Publication: ECS Transactions Pub Date: October 2011 DOI: 10.1149/1.3629952 Bibcode: 2011ECSTr..41f..41L