Evaluation of Interface Trap Density in Advanced SOI MOSFETs Bawedin, Maryline ; Cristoloveanu, Sorin ; Chang, Sungjae ; Valenza, Matteo ; Martinez, Frederic ; Lee, Jonghyun Abstract Publication: ECS Transactions Pub Date: April 2011 DOI: 10.1149/1.3570783 Bibcode: 2011ECSTr..35e.103B