Investigation of ferromagnetic/antiferromagnetic nanostructures using X-ray magnetic dichroism
Abstract
The spin structure of epitaxially grown antiferromagnetic/ferromagnetic bilayer was investigated using X-ray Magnetic Circular Dichroism (XMCD) and X-ray Magnetic Linear Dichroism (XMLD) techniques. The XMLD measurement on the antiferomagnetic film (NiO or CoO) gives a direct probe of the spin orientation of the compensated antiferromagnetic spins. This capability enables us to give a clear clue to the mechanism of the exchange bias in the bilayer and to give a direct observation of the antiferromagnetic vortex.
- Publication:
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APS March Meeting Abstracts
- Pub Date:
- March 2011
- Bibcode:
- 2011APS..MARL16002W