Film Thickness-Dependent Microstructures and Dielectric Properties of Pb(Zr,Ti)O3 Thick Films by Sol-Gel Processing
Abstract
- Publication:
-
Applied Mechanics and Materials
- Pub Date:
- July 2011
- DOI:
- 10.4028/www.scientific.net/AMM.80-81.688
- Bibcode:
- 2011AMM....80..688Z