Dark-field scattering microscopy for spectral characterization of polystyrene aggregates Rebner, Karsten ; Schmitz, Michael ; Boldrini, Barbara ; Kienle, Alwin ; Oelkrug, Dieter ; Kessler, R. W. Abstract Publication: Optics Express Pub Date: February 2010 DOI: 10.1364/OE.18.003116 Bibcode: 2010OExpr..18.3116R