Genesis Cleaning and Particle Analysis Techniques: An Update
Abstract
We are experimenting with various methods for cleaning difficult sample and using a secondary electron microscope with energy dispersive spectroscopy to analyze submicron particulates that are recalcitrant to removal.
- Publication:
-
41st Annual Lunar and Planetary Science Conference
- Pub Date:
- March 2010
- Bibcode:
- 2010LPI....41.1822K