The use of advanced characterization to study transitions across solid state interfaces
Abstract
The atomic-scale study of solid-solid interfaces in complex multi-phase multicomponent systems is a challenging but important endeavor. This article highlights the coupling of recently developed advanced characterization techniques, such as high resolution scanning transmission electron microscopy, carried out in an aberration-corrected microscope, and atom probe tomography, to address the structural and compositional transition at the atomic scale across solid-solid interfaces, such as the γ/γ'interface in nickel-base superalloys and the α/β interface in titanium alloys. Possible implications of such investigations of the interface on the understanding of physical and mechanical properties are discussed.
- Publication:
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JOM - Journal of the Minerals, Metals and Materials Society
- Pub Date:
- December 2010
- DOI:
- 10.1007/s11837-010-0183-7
- Bibcode:
- 2010JOM....62l..64S