Application of Predictive Oscillation-Based Test to a CMOS OpAmp Suenaga, K. ; Isern, E. ; Picos, R. ; Bota, S. ; Roca, M. ; García-Moreno, E. Abstract Publication: IEEE Transactions on Instrumentation Measurement Pub Date: August 2010 DOI: 10.1109/TIM.2009.2031381 Bibcode: 2010ITIM...59.2076S