Flux noise in ion-implanted nanoSQUIDs

Focused ion-beam (FIB) technology has been used to fabricate miniature Nb DC SQUIDs (superconducting quantum interference devices) which incorporate resistively shunted microbridge junctions and a central loop with a hole diameter ranging from 1058 to 50 nm. The smallest device, with a 50 nm hole diameter, has a white flux noise level of 2.6 µΦ₀ Hz^-1/2 at 10⁴ Hz. The scaling of the flux noise properties and focusing effect of the SQUID with the hole size were examined. The observed low frequency flux noises of different devices were compared with the contribution due to the spin fluctuation of defects introduced during FIB processing and of thermally activated flux hopping in the SQUID washer.