Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 - July 30, 2009
- Publication:
-
Microscopy and Microanalysis
- Pub Date:
- July 2009
- DOI:
- 10.1017/S1431927609096093
- Bibcode:
- 2009MiMic..15S.672D