Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy
Abstract
A method of using X-ray absorption spectroscopy together with resolved grazing-incidence geometry for depth profiling of atomic, electronic or chemical local structures in thin films is presented. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.
- Publication:
-
Journal of Applied Crystallography
- Pub Date:
- November 2009
- DOI:
- arXiv:
- arXiv:0901.4542
- Bibcode:
- 2009JApCr..42.1158S
- Keywords:
-
- X-ray absorption spectroscopy (XAS);
- synchrotron radiation;
- X-ray absorption near-edge structure (XANES);
- grazing incidence;
- thin films;
- oxidation;
- depth profiling;
- Condensed Matter - Materials Science
- E-Print:
- 5 pages, 3 figures