Transistor variability after CHC and NBTI stress in 90 nm pMOSFET technology Tu, C. H. ; Chen, S. Y. ; Chuang, A. E. ; Huang, H. S. ; Jhou, Z. W. ; Chang, C. J. ; Chou, S. ; Ko, J. Abstract Publication: Electronics Letters Pub Date: 2009 DOI: 10.1049/el.2009.0678 Bibcode: 2009ElL....45..854T