Neutron Irradiation Test Facilities
Abstract
This chapter reviews the properties and utilization of neutron facilities available for neutron irradiation tests of semiconductor microelectronics devices. The neutron facilities listed in JESD89-Rev (<uri>http://www.seutest.co</uri>, revised version of JESD89 Standard.JESD89A) that are available for semiconductor irradiation tests are described.
- Publication:
-
Terrestrial Neutron-Induced Soft Error in Advanced Memory Devices. Edited by NAKAMURA TAKASHI ET AL. Published by World Scientific Publishing Co. Pte. Ltd
- Pub Date:
- 2008
- DOI:
- 10.1142/9789812778826_0004
- Bibcode:
- 2008tnis.book..139B