Publisher's Note: X-ray diffraction and excitation photoluminescence analysis of ordered GaInP [Phys. Rev. B 58, 15355 (1998)]
Abstract
- Publication:
-
Physical Review B
- Pub Date:
- September 2008
- DOI:
- 10.1103/PhysRevB.78.119901
- Bibcode:
- 2008PhRvB..78k9901F
- Keywords:
-
- 68.55.-a;
- 61.05.C-;
- 73.61.Ey;
- 81.05.Ea;
- 99.10.Fg;
- Thin film structure and morphology;
- X-ray diffraction and scattering;
- III-V semiconductors;
- III-V semiconductors;
- Publisher's note