Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate Sentenac, Anne ; Belkebir, Kamal ; Giovannini, Hugues ; Chaumet, Patrick C. Abstract Publication: Optics Letters Pub Date: February 2008 DOI: 10.1364/OL.33.000255 Bibcode: 2008OptL...33..255S