First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 - August 7, 2008
- Publication:
-
Microscopy and Microanalysis
- Pub Date:
- August 2008
- DOI:
- 10.1017/S1431927608087370
- Bibcode:
- 2008MiMic..14S1370F