An optical fiber-taper probe for wafer-scale microphotonic device characterization
Abstract
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3x10^6) and a planar microring (Q = 4.8x10^6).
- Publication:
-
Optics Express
- Pub Date:
- April 2007
- DOI:
- 10.1364/OE.15.004745
- arXiv:
- arXiv:physics/0702079
- Bibcode:
- 2007OExpr..15.4745M
- Keywords:
-
- Physics - Optics
- E-Print:
- 8 pages, 5 figures, for high-res version see http://copilot.caltech.edu/publications/index.htm